D.C.U., S.; GADDE, S. R.; K, R.; K, K. Double Acceptance Sampling Plan for Odd Generalized Exponential Log-logistic Distribution Based on Truncated Life Test. Digital Manufacturing Technology, Singapore, v. 3, n. 1, p. 76–90, 2023. DOI: 10.37256/dmt.3120232480. Disponível em: https://ojs.wiserpub.com/index.php/DMT/article/view/dmt.v3i12023.76-90. Acesso em: 23 jul. 2024.