D.C.U., Sivakumar, Srinivasa Rao Gadde, Rosaiah K, and Kalyani K. “Double Acceptance Sampling Plan for Odd Generalized Exponential Log-Logistic Distribution Based on Truncated Life Test”. Digital Manufacturing Technology 3, no. 1 (May 31, 2023): 76–90. Accessed July 23, 2024. https://ojs.wiserpub.com/index.php/DMT/article/view/dmt.v3i12023.76-90.