Kammeugne, R. K., Leroux, C. ., Theodorou, C., Vauche, L., Charles, M., Bano, E., & Ghibaudo, G. . (2023). On-Wafer Drain Current Variability in GaN MIS-HEMT on 200-mm Silicon Substrates. Journal of Electronics and Electrical Engineering, 2(1), 12–23. https://doi.org/10.37256/jeee.2120232132