ONIANI, S. 2× Thru De-Embedding Challenges. Journal of Electronics and Electrical Engineering, Singapore, v. 4, n. 1, p. 401–413, 2025. DOI: 10.37256/jeee.4120256598. Disponível em: https://ojs.wiserpub.com/index.php/JEEE/article/view/6598. Acesso em: 6 dec. 2025.