ARUN, D.; SONI, S.; RAJ, A. A. B. Towards Adversarial Robustness of SAR ATR via GANs and Deep Learning. Journal of Electronics and Electrical Engineering, Singapore, v. 5, n. 1, p. 1–14, 2026. DOI: 10.37256/jeee.5120269185. Disponível em: https://ojs.wiserpub.com/index.php/JEEE/article/view/9185. Acesso em: 4 apr. 2026.