Kammeugne, R. K., Leroux, C. ., Theodorou, C., Vauche, L., Charles, M., Bano, E. and Ghibaudo, G. . (2023) “On-Wafer Drain Current Variability in GaN MIS-HEMT on 200-mm Silicon Substrates”, Journal of Electronics and Electrical Engineering. Singapore, 2(1), pp. 12–23. doi: 10.37256/jeee.2120232132.