Ghibaudo, Gerard, and Francis Balestra. “Numerical Simulation of Electro-Thermal Properties in FDSOI MOSFETs Down to Deep Cryogenic Temperatures”. Journal of Electronics and Electrical Engineering 2, no. 1 (April 28, 2023): 24–43. Accessed November 25, 2024. https://ojs.wiserpub.com/index.php/JEEE/article/view/2498.