Ghibaudo G, Balestra F. Numerical Simulation of Electro-Thermal Properties in FDSOI MOSFETs Down to Deep Cryogenic Temperatures. J. Electron. Electric. Eng. [Internet]. 2023 Apr. 28 [cited 2024 May 19];2(1):24–43. Available from: https://ojs.wiserpub.com/index.php/JEEE/article/view/2498